Profiling, Nanoindentation and Thermal Analysis Suite

Horiba Scientific GD Profiler 2

Capabilities:

• Ultra-fast elemental depth profiling of conductive, non-conductive, and heat-sensitive specimens
• Glow discharge source sputters representative areas layer-by-layer
• High-resolution, high-sensitivity emission spectrometer to measure all elements of interest as a function of depth in real-time
• Low vacuum required, simplifying operation
• Can measure all elements from hydrogen to uranium with ppm sensitivity
• Nanometer or even sub-nanometer depth resolution for depth profiling
• Can perform depth profiling from the first nanometer down to ~150 μm deep into the materials
• Extremely fast, only takes minutes to collect the data down to ~100-150 μm deep into the materials

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service

Hysitron TI 980 Nanoindenter

Capabilities:

• Dual piezo scanners deliver high-resolution sample surface topography imaging and nanometer precision test placement
• XPM ultrahigh-speed nanoindentation delivers high-resolution, quantitative mechanical property maps
• nanoDMA® III enables viscoelastic characterization and continuous measurement of properties as a function of depth, frequency, and time
• DMA II module with CMX algorithm provides a quantitative and truly continuous measurement of mechanical properties — including hardness, storage modulus, loss modulus, complex modulus, and tan delta — as a function of indentation depth, frequency, and time.

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service

Asylum Research MFP-3D Origin AFM

Capabilities:

• Scanner ranges from atomic resolution to 120-micrometer x-y scan range and 15-micrometer z range
• Samples up to 80mm diameter and 15mm height
• Full complement of operating modes for fluid and air operation, including Contact/LFM, AC mode/tapping mode with phase and Q-control, electric force microscopy, surface potential microscopy, magnetic force microscopy, piezoresponse microscopy, Dual AC and Dual AC Resonance Tracking (DART), loss tangent imaging, force spectroscopy and force mapping, nanolithography, nanomanipulation

Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service

Netzsch 449 F5 Jupiter Thermal Gravimetric Analyzer/Differential Scanning Calorimeter

Capabilities:

• Sample dehydration/decomposition
• Measure melting point, glass transition, phase transition temperatures
• Heats of reaction
• Isothermal measurements with low balance drift (e.g., oxidation)
• Large sample measurement (up to 35 grams)
• Simultaneous measurement of weight change and true differential heat flow on the same sample from ambient to 1,600 ˚C.
• Location: G6 Straumanis-James Hall
• Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service

TA Instruments Q600

Capabilities:

• Simultaneous measurement of weight change (TGA) and true differential heat flow (DSC) on the same sample from ambient to 1,500 ˚C
• Sample capacity 200 mg, balance sensitivity 0.1 mg
• Mass flow controller with automatic gas switching
• Pt/Pt-Rh (Type R) thermocouples
• Heating rate – up to 1000 0C – 0.1 to 100 0C/min, 25°C/min up to 1500°C
• Location: G6 Straumanis-James Hall
• Check Availability | Reserve Equipment via FOM (trained users) | Faculty Authorization Form | Request Service

Nanoscope III Scanning Probe Microscopy (AFM)

Capabilities:

• The Digital Instruments Nanoscope IIIA is a multimode scanning probe microscope capable of performing scanning tunneling microscopy, atomic force microscopy (tapping and contact mode), and magnetic force microscopy

Contact the Specialist for Availability Inquiry

Hirox KH 8700 Digital Optical Microscope

Capabilities:

• 2.11 Mega-pixel CCD sensor, 24-frame video at 1600 x 1200 pixels
• High-intensity LED light source, 5700 K color temperature
• Motorized z-axis with 50 nm step resolution
• 2D measurement functions: distance, angle, radius, diameter, etc.
• 3D measurement functions including surface roughness
• MXG-2500REZ objective (35x to 2500x) and MXG-10C objective (up to 7000x)

Contact the Specialist for Availability Inquiry